6 results
Influence of near-surface and volume real structure on the electronic properties of SrTiO3 MIM structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1368 / 2011
- Published online by Cambridge University Press:
- 23 June 2011, mrss11-1368-ww08-19
- Print publication:
- 2011
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Measurement of the ratio of substitutional to interstitial dopant-incorporation in nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 428-429
- Print publication:
- September 2007
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Studies of core structures and strain fields of extended defects in GaN using Exit-Wave-Reconstruction and numerical correction of lens aberrations
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 38-39
- Print publication:
- September 2007
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Formation and Thermal Stability of End-of-Range Defects in Ge Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 167
- Print publication:
- 1993
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Formation of Extrinsic Defects at the Amorphouscrystalline Interface in Ion-Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 319 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 189
- Print publication:
- 1993
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Formation of End-of-Range Defects in Silicon at Low Temperatures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 262 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 1103
- Print publication:
- 1992
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